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10:00 |
Opening Remarks |
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88.1 |
10:00 |
In Situ Material Characterization of Curved Samples using Analysis of Gaussian Beam Reflection from a Convex Cylindrical Shell "V. V. Varadan, K. Du, The Pennsylvania State University, USA" |
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88.2 |
10:20 |
Electromagnetic Material Characterization Using a H-Plane Step Rectangular Waveguide "M. Havrilla, Air Force Institute of Technology, E. Rothwell, Michigan State University, USA" |
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88.3 |
10:40 |
"Quadrupole Terms in Magnetic Singularity Identification, Part 2" "C. E. Baum, Air Force Research Laboratory, USA" |
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88.4 |
11:00 |
A Comparison of One-Tier and Two-Tier Stripline Calibration Techniques for Applications in Electromagnetic Material Characterization Measurements "A. Bogle, L. Kempel, E. Rothwell, D. Nyquist, Michigan State University, M. Havrilla, Air Force Institute of Technology, USA" |
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88.5 |
11:20 |
Calibration of RF Power Meters Based on an Isothermal Method "Y. Hsiao, Y. Lu, C. Huang, H.-T. Chou, Yuan Ze University, D. Lin, Chung-Shan Institute of Science and Technology, Taiwan" |
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88.6 |
11:40 |
AUXILIARY POTENTIALS IN PSEUDOCHIRAL OMEGA MEDIA "R. Saraei, J. Rashed-Mohassel, Tehran University, Tehran, Tehran, Iran" |